Characterization of microstructures by analytical electron microscopy (AEM) =
- 出版日期：2012.
- 出版者：Higher Education Press,
- 页数：xviii, 552p. :
- 出版地：Beijing :
- 第一责任说明：Yonghua Rong.
- 尺寸：25 cm.
- 分类号：a155.38
- ISBN：978-7-04-030092-5(hbk.) :
MARC全文
02h0028368 20120618144904.0 120412s2012 cc a frb |001|||eng | 978-7-04-030092-5(hbk.) : CNY119.00 NGL a155.38 aO657.99 Rong, Yonghua. Characterization of microstructures by analytical electron microscopy (AEM) = 微观组织的分析电子显微学表征 / Yonghua Rong. 微观组织的分析电子显微学表征 English ed. Beijing : Higher Education Press, 2012. xviii, 552p. : ill. ; 25 cm. HEP series in materials science and engineering = ; 材料科学与工程著作系列 Includes bibliographical references and index. The Analytical Electron Microscope (AEM).- Specimen Preparation.- Electron Diffraction.- Mathematics Analysis in Electron Diffraction and Crystallography.- Diffraction Contrast.- High Resolution and High Spatial Resolution of Analytical Electron Microscopy. This book reviews basic concepts and operative techniques of AEM, focusing on the study of phase transformations and dislocation in deformation by AEM. Numerous examples illustrate physical concepts and mathematic analysis for diffraction and crystallography. Electron microscopy Technique. 材料科学与工程著作系列 aCN bNGL NGL 155.38 R66 wtxi1203 h1 ; rCNY119.00