Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline
详细信息 查看全文
- 作者：Michael W. M. Jones ; Nicholas W. Phillips ; Grant A. van Riessen ; Brian Abbey ; David J. Vine ; Youssef S. G. Nashed ; Stephen T. Mudie ; Nader Afshar ; Robin Kirkham ; Bo Chen ; Eugeniu Balaur and Martin D. de Jonge
- 关键词：X-ray fluorescence ; scanning X-ray diffraction microscopy ; ptychography
- 刊名：Journal of Synchrotron Radiation
- 出版年：2016
- 出版时间：September 2016
- 年：2016
- 卷：23
- 期：5
- 页码：1151-1157
- 全文大小：1166K
- ISSN：1600-5775
文摘
Owing to its extreme sensitivity, quantitative mapping of elemental distributions via X-ray fluorescence microscopy (XFM) has become a key microanalytical technique. The recent realisation of scanning X-ray diffraction microscopy (SXDM) meanwhile provides an avenue for quantitative super-resolved ultra-structural visualization. The similarity of their experimental geometries indicates excellent prospects for simultaneous acquisition. Here, in both step- and fly-scanning modes, robust, simultaneous XFM-SXDM is demonstrated.