Depth profiling cross-linked poly(methyl methacrylate) films: a time-of-flight secondary ion mass spectrometry approach

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• 作者：Soheila Naderi-Gohar ; Kevin M.H. Huang ; Yiliang Wu ; Woon Ming Lau and Heng-Yong Nie
• 刊名：Rapid Communications in Mass Spectrometry
• 出版年：2017
• 出版时间：28 February 2017
• 年：2017
• 卷：31
• 期：4
• 页码：381-388
• 全文大小：497K
• ISSN：1097-0231

文摘

In order to determine the degree of cross-linking on the surface and its variations in a nanometer-scale depth of organic materials, we developed an approach based on time-of-flight secondary ion mass spectrometry (TOF-SIMS), which provides rich chemical information in the form of fragment ions. TOF-SIMS is extremely surface-sensitive and capable of depth profiling with the use of a sputter ion beam to remove controllable amounts of substance.