Triple ion beam cutting of diamond/Al composites for interface characterization

详细信息    查看全文

• 作者：Gang Ji ; Zhanqiu Tan ; Rajashekhara Shabadi ; Zhiqiang Li ; Wolfgang Gr眉newald ; Ahmed Addad ; Dominique Schryvers ; Di Zhang
• 关键词：Diamond/Al composite ; Metal matrix composites ; Triple ion beam cutting ; Interface characterization ; Electron microscopy
• 刊名：Materials Characterization
• 出版年：March, 2014
• 年：2014
• 卷：89
• 期：Complete
• 页码：132-137
• 全文大小：823 K

文摘

A novel triple ion beam cutting technique was employed to prepare high-quality surfaces of diamond/Al composites for interfacial characterization, which has been unachievable so far. Near-perfect and artifact-free surfaces were obtained without mechanical pre-polishing. Hence, the as-prepared surfaces are readily available for further study and also, ready to be employed in a focus ion beam system for preferential selection of transmission electron microscopy samples. Dramatically different diamond/Al interface configurations 鈥?sub-micrometer Al₂O₃ particles and clean interfaces were unambiguously revealed.