Enhancement of optical and structural properties of vacuum evaporated CdTe thin films
详细信息 查看全文
- 作者：Subhash Chandera ; b ; sckhurdra@gmail.com" class="auth_mail" title="E-mail the corresponding author ; A. Purohita ; C. Lalc ; M.S. Dhakaa ; b
- 关键词：Thin films ; Vacuum deposition ; Optical properties ; X-ray diffraction ; Electrical properties
- 刊名：Materials Chemistry & Physics
- 出版年：2017
- 出版时间：1 January 2017
- 年：2017
- 卷：185
- 期：Complete
- 页码：202-209
- 全文大小：2382 K
文摘
- •
Enhancement of physical properties of vacuum evaporated CdTe thin films has been investigated.
- •
Structural analysis reveals that the films are crystallized in cubic zinc-blende structure.
- •
Optical band gap is found in the range 1.57–1.87 eV and observed to decrease with annealing temperature.
- •
Electrical resistivity is observed to decrease with annealing.
- •
Morphology studies show that the films are uniform, homogeneous and free from defects.