Probing the bulk heterojunction morphology in thermally annealed active layers for polymer solar cells

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• 作者：N. Van den Brande^a ; ¹ ; ^{npvdbran@vub.ac.be} ; N. Patil^b ; ¹ ; M. Guizar-Sicairos^c ; R. Claessens^a ; G. Van Assche^a ; D.W. Breiby^b ; ^d ; ^{breiby@ntnu.no} ; B. Van Mele^a ; ^{bvmele@vub.ac}
• 关键词：Organic photovoltaics ; X-ray ptychography ; Chip calorimetry ; P3HT ; PCBM
• 刊名：Organic Electronics
• 出版年：2017
• 出版时间：February 2017
• 年：2017
• 卷：41
• 期：Complete
• 页码：319-326
• 全文大小：1618 K
• 卷排序：41

文摘

Chip calorimetry and X-ray ptychography were combined to study OPV active layers. Fast scanning rates avoid non-isothermal effects yielding true isothermal annealing. P3HT/PC61BM thin layers were studied as a reference system. Initial finely grained morphology at start of annealing is seen thermally. The preceding thermal pathway before annealing greatly influences morphology.