Effects of interface roughness on cohesive strength of self-assembled monolayers

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• 作者：Chen Zhang^a ; Amnaya P. Awasthi^c ; Philippe H. Geubelle^a ; ^{geubelle@illinois.edu} ; Martha E. Grady^b ; Nancy R. Sottos^b
• 关键词：Self-assembled monolayers ; Nano-scale interfacial roughness ; Cohesive models ; Thin films ; Spallation ; Interfacial strength
• 刊名：Applied Surface Science
• 出版年：2017
• 出版时间：1 March 2017
• 年：2017
• 卷：397
• 期：Complete
• 页码：192-198
• 全文大小：1813 K
• 卷排序：397

文摘

Self-assembled monolayer/transfer-printed gold interface modeled using continuum-level simulation. Initial deformed film profile analyzed and instability assessed. Effective cohesive response of SAM-enhanced interface extracted from spallation model. Reduction of up to 70% cohesive strength of the interface from incorporation of roughness demonstrated.