The dependence of dielectric properties on the thickness of (Ba,Sr)TiO₃ thin films

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• 作者：Jeongmin Oh ; Taeho Moon ; Tae-Gon Kim ; Chunjoong Kim ; Jae Hun Lee ; Sang Young Lee ; Byungwoo Park
• 关键词：(Ba ; Sr)TiO₃ ; Dielectric loss ; Dielectric constant ; Relaxation ; Local strain
• 刊名：Current Applied Physics
• 出版年：2007
• 出版时间：February 2007
• 年：2007
• 卷：7
• 期：2
• 页码：168-171
• 全文大小：250 K

文摘

In the dielectric (Ba,Sr)TiO₃ thin films, the correlation between the film thickness and the dielectric properties was investigated. The dielectric properties such as the dielectric constant (ε) and dielectric loss (tan δ) were measured using the capacitor geometry. As the film thickness increased, the dielectric constant also increased due to the reduction of the interfacial dead-layer effect. However, the dielectric loss did not show a monotonous variation with the increasing film thickness. It was found that the dielectric loss correlated well with the non-uniform distribution of local strain, as analyzed by X-ray diffraction, according to the Curie–von Schweidler relaxation law.