Creating an invalid defect classification model using text mining on server development

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• 作者：Yihsiung Su^a ; ^{simonyhsu@gmail.com} ; Pin Luarn^b ; ^{luarn@ba.ntust.edu.tw} ; Yue-Shi Lee^c ; ^{leeys@mail.mcu.edu.tw} ; Show-Jane Yen^c ; ^{sjyen@mail.mcu.edu.tw}
• 关键词：Invalid defect ; Classification ; Text mining ; Server development ; Project management ; BIOS
• 刊名：Journal of Systems and Software
• 出版年：2017
• 出版时间：March 2017
• 年：2017
• 卷：125
• 期：Complete
• 页码：197-206
• 全文大小：1063 K
• 卷排序：125

文摘

BIOS firmware demonstrates the maximum number of defects and invalid defects. 15.9% of BIOS development time was spent on investigating invalid defects. WUDO classification includes four invalid defect types. The type, working as designed, accounts for the maximum of 45% of invalid defects. Finding a stable classification algorithm to classify the invalid defect types.