Thickness-dependent dispersion parameters, energy gap and nonlinear refractive index of ZnSe thin films
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- 作者：Deo Prakasha ; E.R. Shaabanb ; esam_ramadan2008@yahoo.com" class="auth_mail" title="E-mail the corresponding author ; M. Shapaanc ; S.H. Mohamedd ; A.A. Othmane ; K.D. Vermaf ; kdverma1215868@gmail.com" class="auth_mail" title="E-mail the corresponding author
- 关键词：A. Semiconductors ; A. Thin films ; C. X-ray diffraction ; B. Microstructure ; B. Optical properties
- 刊名：Materials Research Bulletin
- 出版年：2016
- 出版时间：August 2016
- 年：2016
- 卷：80
- 期：Complete
- 页码：120-126
- 全文大小：1211 K
文摘
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Combined experimental and theoretical researches on ZnSe Thin Films.
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The film thickness and refractive index were determined using envelope method.
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The absorption coefficient and the energy gap were calculated.
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Dispersion parameters were determined using Wemple-DiDomenico relation.
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The third order susceptibility and nonlinear refractive index were calculated.