A method to overcome the diffraction limit in infrared microscopy using standing waves in an attenuated total reflection configuration

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• 作者：Nordine Hendaoui^a ; ^{nhendaoui@cdta.dz" class="auth_mail" title="E-mail the corresponding author} ; Aladin Mani^b ; Ning Liu^c ; Syed M. Tofail^c ; Christophe Silien^c ; André ; Peremans^d
• 关键词：Infrared microscopy ; Far field ; Label free ; Super-resolution ; ATR configuration
• 刊名：Optics Communications
• 出版年：2017
• 出版时间：1 January 2017
• 年：2017
• 卷：382
• 期：Complete
• 页码：574-579
• 全文大小：1330 K

文摘

A method is proposed to overcome the diffraction limit of spatial resolution in infrared microscopy. To achieve this, standing waves in an attenuated total reflection configuration were generated to spatially modulate the absorbance of adsorbate vibrational transitions. A numerical simulation was undertaken. It showed that chemical imaging with a spatial resolution of approximately 100 nm is achievable in the case of self-assembled patterns (ofoctdecyltrichlorosilane [CH3-(CH₂)₁₇-SiCl₃]), when probing the methyl modes located near 3.5 micrometres.