Evidencing extrinsic stacking faults in twinning-induced plasticity steel

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• 关键词：Scanning transmission electron microscopy (STEM) ; Extrinsic stacking faults ; Intrinsic stacking faults ; Twinning ; Schmid factor ; TWIP steel
• 刊名：Materials Characterization
• 出版年：2017
• 出版时间：January 2017
• 年：2017
• 卷：123
• 期：Complete
• 页码：275-281
• 全文大小：1395 K
• 卷排序：123

文摘

Aberration corrected STEM was used to investigate stacking faults in TWIP steel. Extrinsic stacking faults were observed in 〈100〉 grains parallel to the tensile axis. ESFs serve as nuclei for deformation twins and also contribute to twin growth. Twinning in 〈100〉 grains is not necessarily a deviation from Schmid's law. Twinning via intrinsic stacking faults was also observed in 〈100〉 grains.