A novel numeric model is developed to predict the effective detector collection angle for multi-detector EDS in the transmission electron microscope.
The precise geometry of specimen holder is incorporated to determine the influence of holder shadowing
The role of X-ray filtering by the Be specimen carrier is investigated.
Predicted counts and intensity ratios are directly compared to experiment as a function of tilt and are shown to be in excellent agreement
The detector intensity sum effectively reduces errors compared to the individual detector signals.