文摘
Tin oxide (SnO2) thin films have been prepared by dc reactive magnetron sputtering on glass substrates at different substrate bias voltages and substrate temperatures. The intensity of the peaks and polycrystalline nature of the films are increases with increasing the substrate bias voltage and substrate temperature. From the electron probe micro analysis results, the films deposited at substrate temperature of 473 K was nearly stoichiometry and the atomic percentage of Sn/O ratio was 0.52. From the PL spectra, the emission peak intensity increases with substrate bias voltages and substrate temperatures. The films deposited at substrate bias voltages of −100 V exhibited optical band gap of 3.67 eV with electrical resistivity of 0.5 Ωcm. The films deposited at substrate temperature of 573 K shows the low electrical resistivity of 0.008 Ωcm.