Optical spectroscopy is performed on specially-designed UD+ GaN samples. A change in CER signal direction reveals different band bending in Si-doped and Mg-doped samples. The position of the surface Fermi level (below the CB) is established: 0.6 eV for Si doped and ∼1.7 eV for Mg doped samples. DFT calculations confirm the bistability of the surface Fermi level of GaN(0001).