A novel 4H-SiC structure named DURP MESFET is proposed.
A double upper gate and a recessed p-buffer are employed in the DURP MESFET.
DC and RF characteristics are simulated.
Compared with DR MESFET, DURP MESFET obtains higher drain current and breakdown voltage.
An evident decrease in gate-source capacitance of DURP MESFET is achieved.