A H2 sensor that composed of Pd thin films on an elastomeric substrate was tested after annealed at 80–200 °C, respectively. The wrinkling wavelength and compressive stress of the Pd/PDMS were estimated using simple equations. Higher annealing temperatures led to a decrease in the wrinkling wavelength and an increase in the width of the Pd nanogap. The enlarged Pd nanogap contributed to a decrease in the performance of the sensor.