ZnSe by electron-beam evaporation used for facet passivation of high power laser diodes

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• 作者：Xiongwen Shu ; Chen Xu ; Zengxia Tian and Guangdi Shen
• 关键词：Electron-beam evaporation ; Passivation ; Facet ; Reliability
• 刊名：Solid-State Electronics
• 出版年：2005
• 出版时间：December 2005
• 年：2005
• 卷：49
• 期：12
• 页码：2016-2017
• 全文大小：77 K

文摘

The paper reports for the first time a simple, economical and available way for passivating air cleaved facets of high power semiconductor lasers with Al-contained active region using a electron-beam evaporated ZnSe thin layer, which was demonstrated to be an effective way for improving the reliability of high power lasers.