文摘
Samples of (100)-oriented PZT thin films with 0–2 at % rare earth Eu dopant (PEZT) were fabricated on (111)Pt/Ti/SiO2/Si substrate by a sol–gel method. Ferroelectric properties such as P–V loop, C–V and I–V characteristics were investigated with RT-66A tester and HP4194 impendence analyzer, respectively. Improved polarization (Pr