Improving stability of organic devices: a time/space resolved structural monitoring approach applied to plasmonic photovoltaics
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- 作者：Barbara Pacia ; barbara.paci@artov.ism.cnr.it" class="auth_mail" title="E-mail the corresponding author ; George Kakavelakisb ; Amanda Generosia ; Jonathan Wrightc ; Claudio Ferreroc ; Emmanuel Stratakisb ; d ; Emmanuel Kymakisb
- 关键词：Organic photovoltaics ; In-situ characterization methods ; Bulk heterojunction ; Plasmonic metal nanoparticles ; Degradation mechanisms
- 刊名：Solar Energy Materials and Solar Cells
- 出版年：2017
- 出版时间：January 2017
- 年：2017
- 卷：159
- 期：Complete
- 页码：617-624
- 全文大小：2530 K
文摘
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The possibility to improve the efficiency and stability of organic photovoltaics via nanoparticles-based plasmonic devices was addressed.
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An unconventional approach, based on in-situ time/space resolved high spatial resolution synchrotron radiation X-ray diffraction applied to integrated devices, was used for the first time.
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The study allowed the kinetics of NP distribution inside the photoactive film and the nanoscale modifications of the structural/interface properties of each layer composing the device to be elucidated.