X-ray photoelectron spectroscopic studies of CeO2 thin films deposited on Ni-W (100), c-Al2O3 (0001) and Si (100) substrates
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- 作者：Preetam Singh ; K.M.K. Srivatsa ; kmks@nplindia.org" class="auth_mail" title="E-mail the corresponding author ; Arun Barvat ; Prabir Pal
- 关键词：CeO2 thin film ; Magnetron sputtering ; Biaxially textured Ni-W substrate ; XPS ; UPS
- 刊名：Current Applied Physics
- 出版年：2016
- 出版时间：October 2016
- 年：2016
- 卷：16
- 期：10
- 页码：1388-1394
- 全文大小：1469 K
文摘
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The electronic structure of CeO2 buffer layer is important to grow the desired layers over it.
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The oxidation states of CeO2 films deposited on different substrates were investigated using XPS.
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No reports are available on the XPS studies of CeO2 film on biaxially textured Ni-W substrate.
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The Ce3d and O1s core level spectra reveal that the films mostly consist of Ce4+ species.
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Valance band maxima value (∼2.6 eV) shows that all the deposited films are n-type in nature.