Rectification of sulphur deficiency defect in CdS based films by introducing a novel modification in the SILAR cyclic process
详细信息 查看全文
- 作者：K. Ravichandrana ; kkr1365@yahoo.com" class="auth_mail" title="E-mail the corresponding author ; kkravi1365@gmail.com" class="auth_mail" title="E-mail the corresponding author ; N. Nisha Banua ; b ; V. Senthamil Selvib ; B. Muralidharanc ; T. Arund
- 关键词：Thin films ; SILAR ; X-ray diffraction ; Compositional analysis
- 刊名：Journal of Alloys and Compounds
- 出版年：2016
- 出版时间：5 December 2016
- 年：2016
- 卷：687
- 期：Complete
- 页码：402-412
- 全文大小：3206 K
文摘
- •
Sulphur deficiency in SILAR deposited CdS film is rectified by a novel modification.
- •
Sulphur deficiency is reduced by six times from that of ordinary SILAR technique.
- •
First report on CdS:Fe thin films prepared using improved SILAR technique.
- •
Near stoichiometry and improved transparency are achieved for all the samples.