Characterization and FDTD simulation analysis on light trapping structures of amorphous silicon thin films by laser irradiation
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- 作者：Lu Huanga ; lhuang@shu.edu.cn" class="auth_mail" title="E-mail the corresponding author ; Jing Jina ; Zhijun Yuanb ; Weiguang Yanga ; Linjun Wanga ; Weimin Shia ; Jun Zhoub ; Qihong Loub
- 关键词：Light trapping ; Amorphous silicon ; Finite difference time domain ; Laser irradiation
- 刊名：Superlattices and Microstructures
- 出版年：2016
- 出版时间：May 2016
- 年：2016
- 卷：93
- 期：Complete
- 页码：290-296
- 全文大小：1454 K
文摘
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The light trapping structures of α-Si thin film are formed by pulsed laser irradiation.
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Different reflection spectra corresponding to h/D are obtained by FDTD simulation.
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Reflection spectra with different structure are measured by UV–visible spectroscopy.
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The morphology characterization verifies light-trapping modeling in the simulation.