Characterization of x-ray imaging crystal spectrometer for high-resolution spatially-resolved x-ray Thomson scattering measurements in shock-compressed experiments

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• 作者：J. Lu^a ; ^b ; ^{jianlu1003@Gmail.com} ; K.W. Hill^c ; M. Bitter^c ; N.A. Pablant^c ; L.F. Delgado-Aparicio^c ; P.C. Efthimion^c ; H.J. Lee^d ; U. Zastrau^d ; ^e
• 关键词：X-ray spectrometer ; X-ray Thomson scattering ; Warm dense matter ; High resolving power
• 刊名：Journal of Quantitative Spectroscopy and Radiative Transfer
• 出版年：2017
• 出版时间：January 2017
• 年：2017
• 卷：187
• 期：Complete
• 页码：247-254
• 全文大小：2000 K
• 卷排序：187

文摘

A dual-channel x-ray crystal spectrometer for XRTS measurements was developed. The capabilities of high spectral and spatial resolution were characterized. Back scattered spectra from warm dense carbon samples using XFEL was collected. Spatial profiles of elastic peaks were compared with spatial-resolved spectra.