用户名: 密码: 验证码:
Simulation of resolution properties of microchannel plate
详细信息    查看全文
文摘
To improve the resolution capabilities of MCP, numerical simulation of the MTF of MCP has been made. Solving the electron trajectory equation, we obtain the potential distribution of MCP, and then obtain the electron trajectory in MCP. On this basis, a group of MTF curves are plotted by varying the tilt angle, the channel diameter, and the output end spoiling depth, individually. The simulation results show that in a moderate range a larger the tilt angle, a smaller the channel diameter, and a deeper the output end spoiling depth can improve the resolution of MCP significantly, according to the state of the art. Research on the effect of the above parameters on the resolution properties of MCP will provide a theoretical support for developing MCP with high resolution and further improving the resolution of image intensifiers.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700