Defects formation of the in situ

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• 作者：Qingchang Meng ; Haibo Feng ; Guangchang Chen ; Ronghai Yu ; Dechang Jia ; Yu Zhou
• 关键词：A1. Dislocation ; A1. TEM ; A1. Microstructure ; A1. Defects ; B1. TiB
• 刊名：Journal of Crystal Growth
• 出版年：2009
• 出版时间：1 March 2009
• 年：2009
• 卷：311
• 期：6
• 页码：1612-1615
• 全文大小：504 K

文摘

Coarse and fine TiB whiskers were formed during the reaction synthesized TiB reinforced Ti matrix composites. The microstructure of the as-synthesized TiB whiskers has been investigated by TEM and HREM. Dislocations and stacking faults were observed in the coarse TiB whiskers, and only high-density stacking faults presented in the fine TiB whiskers. The formation of dislocations is related to the stacking faults, the formation mechanism and atomic structure of dislocations in the in situ synthesized TiB whiskers was suggested.