X-ray diffraction line profile analysis of nanostructured nickel oxide: Shape factor and convolution of crystallite size and microstrain contributions

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• 作者：K. Maniammal^a ; G. Madhu^b ; V. Biju^a ; ^{bijunano@gmail.com}
• 关键词：Defects ; X-ray diffraction ; Microstrain ; Line broadening ; Shape factor ; Nanostructured materials
• 刊名：Physica E: Low-dimensional Systems and Nanostructures
• 出版年：2017
• 出版时间：January 2017
• 年：2017
• 卷：85
• 期：Complete
• 页码：214-222
• 全文大小：1070 K
• 卷排序：85

文摘

Extraction of size and microstrain contributions to XRD line broadening. Use of W-H and SSP methods to analyze crystallite size and microstrain. Analysis of Shape factor for explaining why SSP method is more suitable in the present case. Suitability of SSP method to deconvolute size and strain of small crystallites. Use of Rietveld refinement of the XRD pattern to reveal lattice expansion.