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Simulation studies of the n+n?/sup> Si sensors having p-spray/p-stop implant for the SiD experiment
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文摘
Silicon Detector (SiD) is one of the proposed detectors for the future International Linear Collider (ILC). In the innermost vertex of the ILC, Si micro-strip sensors will be exposed to the neutron background of around 1?.6¡Á1010 1 MeV equivalent neutrons cm? year?. The p+n?/sup>n+ double-sided Si strip sensors are supposed to be used as position sensitive sensors for SiD. The shortening due to electron accumulation on the n+n?/sup> side of these sensors leads to uniform spreading of signal over all the n+ strips and thus ensuring good isolation between the n+ strips becomes one of the major issues in these sensors. One of the possible solutions is the use of floating p-type implants introduced between the n+ strips (p-stops) and another alternative is the use of uniform layer of p-type implant on the entire n-side (p-spray). However, pre-breakdown micro-discharge is reported because of the high electric field at the edge of the p-stop/p-spray. An optimization of the implant dose profile of the p-stop and p-spray is required to achieve good electrical isolation while ensuring satisfactory breakdown performance of the Si sensors. Preliminary results of the simulation study performed on the n+n?/sup> Si sensors having p-stop and p-spray using device simulation program, ATLAS, are presented.

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