An effective method of predicting perovskite solar cell lifetime-Case study on planar CH3NH3PbI3 and HC(NH2)2PbI3 perovskite solar cells and hole transfer materials of spiro-OMeTAD and PTAA
Thermal stress tests at 45 °C, 65 °C and 85 °C on MAPbI3 and FAPbI3/Spiro-OMeTAD and PTAA structures and solar cells. MAPbI3/Spiro-OMeTAD cell is the least thermal stable followed by FAPbI3/Spiro-OMeTAD cell and FAPbI3/PTAA cell. A reliable method of calculating lifetimes of 3 types of planar perovskite solar cells is developed in this work.