Spatially-resolved cathodoluminescence spectroscopy of ZnO defects

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• 作者：L.J. Brillson^a ; ^b ; ^{brillson.1@osu.edu" class="auth_mail" title="E-mail the corresponding author} ; W.T. Ruane^b ; H. Gao^b ; Y. Zhang^c ; J. Luo^c ; H. von Wenckstern^d ; M. Grundmann^d
• 关键词：Cathodoluminescence spectroscopy ; ZnO ; Defects ; Nanostructures
• 刊名：Materials Science in Semiconductor Processing
• 出版年：2017
• 出版时间：January 2017
• 年：2017
• 卷：57
• 期：Complete
• 页码：197-209
• 全文大小：1604 K

文摘

Spatially-resolved cathodoluminescence spectroscopy has contributed significant new information to our understanding of native point defects in ZnO micro- and nanoscale structures. This paper aims to review representative examples of this work and the new perspectives gained from spatially resolving these defects both laterally and depth-wise. Results obtained from many groups worldwide include studies of Schottky diodes, polycrystalline ceramics, nanostructures, and microwires. The nature and spatial distribution of native point defects in these materials together with their strong dependence on growth and processing suggest new avenues for their control in transport and optoelectronic device structures.