A new method to detect and correct sample tilt in scanning transmission electron microscopy bright-field imaging

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• 作者：H.G. Brown^a ; R. Ishikawa^b ; G. Sá ; nchez-Santolino^b ; N.R. Lugg^b ; ^{shibata@sigma.t.u-tokyo.ac.jp} ; Y. Ikuhara^b ; L.J. Allen^a ; N. Shibata^b ;
• 关键词：Scanning transmission electron microscopy (STEM) ; Annular bright-field (ABF) imaging ; Central bright-field (CBF) imaging ; Sample tilt
• 刊名：Ultramicroscopy
• 出版年：2017
• 出版时间：February 2017
• 年：2017
• 卷：173
• 期：Complete
• 页码：76-83
• 全文大小：1744 K
• 卷排序：173

文摘

Octahedral distortions are associated with displacements of lighter atoms. Annular bright-field imaging is sensitive to light and heavy atoms simultaneously. Mistilt of the specimen leads to errors in position measurements of lighter elements. It is possible to detect tilt using images taken by a central bright-field detector. Tilt may be offset by shifting the diffraction plane detector by an equivalent amount.