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Effect of Ni to the Cu substrate on the interfacial reaction with Sn-Cu solder
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文摘

Ni addition to Cu alloy affects the diffusion of Cu and Sn atoms, which in turn affects the growth of the Cu3Sn.

A Ni-rich interfacial reaction layer ((Ni,Cu)3Sn) about 600 nm in thickness was formed at the Cu-0.2%Ni/Cu3Sn interface.

Thermodynamic analysis revealed that a diffusion path was from the Cu3Sn to the Cu-0.2%Ni, by way of (Ni,Cu)3Sn.

Calculation results are interpreted as the (Ni,Cu)3Sn mitigates the effect of Ni on the diffusion driving force.

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