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Study on microwave dielectric properties of corundum type () ceramics for designing a microwave low pass filter
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This paper reports the study of structural, morphological and microwave dielectric properties of pan id="mmlsi0022" class="mathmlsrc">pan class="formulatext stixSupport mathImg" data-mathURL="/science?_ob=MathURL&_method=retrieve&_eid=1-s2.0-S0272884215024372&_mathId=si0022.gif&_user=111111111&_pii=S0272884215024372&_rdoc=1&_issn=02728842&md5=cb121f438b8f06542d298f7a19c18cb4" title="Click to view the MathML source">(Mg1−xCox)4Ta2O9pan>pan class="mathContainer hidden">pan class="mathCode">ath altimg="si0022.gif" overflow="scroll">(athvariant="normal">Mg1athvariant="italic">xathvariant="normal">Coathvariant="italic">x)4athvariant="normal">Ta2athvariant="normal">O9ath>pan>pan>pan> (pan id="mmlsi0023" class="mathmlsrc">pan class="formulatext stixSupport mathImg" data-mathURL="/science?_ob=MathURL&_method=retrieve&_eid=1-s2.0-S0272884215024372&_mathId=si0023.gif&_user=111111111&_pii=S0272884215024372&_rdoc=1&_issn=02728842&md5=3bee9376721535f6e4d8d783d8b9bbb6" title="Click to view the MathML source">x=0–0.6pan>pan class="mathContainer hidden">pan class="mathCode">ath altimg="si0023.gif" overflow="scroll">athvariant="italic">x=0–0.6ath>pan>pan>pan>) ceramics, sintered at 1300–1400 °C. The grown samples were characterized by means of X-ray diffraction, Fourier transform infrared spectroscopy, scanning electron microscopy and energy dispersive X-ray spectroscopy. Microwave dielectric properties of these samples were investigated using the pan id="mmlsi0024" class="mathmlsrc">pan class="formulatext stixSupport mathImg" data-mathURL="/science?_ob=MathURL&_method=retrieve&_eid=1-s2.0-S0272884215024372&_mathId=si0024.gif&_user=111111111&_pii=S0272884215024372&_rdoc=1&_issn=02728842&md5=5f9d77afd4487b9888adfe202179a174" title="Click to view the MathML source">TE01δpan>pan class="mathContainer hidden">pan class="mathCode">ath altimg="si0024.gif" overflow="scroll">TE01δath>pan>pan>pan> dielectric resonator method. Our study shows that the dielectric properties are strongly dependent on the compositions, densification and micro-structure of the specimens. Out of these compositions, pan id="mmlsi0025" class="mathmlsrc">pan class="formulatext stixSupport mathImg" data-mathURL="/science?_ob=MathURL&_method=retrieve&_eid=1-s2.0-S0272884215024372&_mathId=si0025.gif&_user=111111111&_pii=S0272884215024372&_rdoc=1&_issn=02728842&md5=cf8b960beae2bf1f34fc1c909b733110" title="Click to view the MathML source">(Mg0.7Co0.3)4Ta2O9pan>pan class="mathContainer hidden">pan class="mathCode">ath altimg="si0025.gif" overflow="scroll">(Mg0.7Co0.3)4Ta2athvariant="normal">O9ath>pan>pan>pan> shows near zero pan id="mmlsi0011" class="mathmlsrc">pan class="formulatext stixSupport mathImg" data-mathURL="/science?_ob=MathURL&_method=retrieve&_eid=1-s2.0-S0272884215024372&_mathId=si0011.gif&_user=111111111&_pii=S0272884215024372&_rdoc=1&_issn=02728842&md5=1fb5bc4d2c285b2df13b7e090f85ea30" title="Click to view the MathML source">τfpan>pan class="mathContainer hidden">pan class="mathCode">ath altimg="si0011.gif" overflow="scroll">athvariant="italic">τathvariant="italic">fath>pan>pan>pan> with a dielectric constant pan id="mmlsi0026" class="mathmlsrc">pan class="formulatext stixSupport mathImg" data-mathURL="/science?_ob=MathURL&_method=retrieve&_eid=1-s2.0-S0272884215024372&_mathId=si0026.gif&_user=111111111&_pii=S0272884215024372&_rdoc=1&_issn=02728842&md5=f527ec1fa4b631b1b52960a66bfe263e" title="Click to view the MathML source">ϵrpan>pan class="mathContainer hidden">pan class="mathCode">ath altimg="si0026.gif" overflow="scroll">ϵathvariant="normal">rath>pan>pan>pan>pan id="mmlsi0027" class="mathmlsrc">pan class="formulatext stixSupport mathImg" data-mathURL="/science?_ob=MathURL&_method=retrieve&_eid=1-s2.0-S0272884215024372&_mathId=si0027.gif&_user=111111111&_pii=S0272884215024372&_rdoc=1&_issn=02728842&md5=eda006f01831be3478657933a7966182" title="Click to view the MathML source">~pan>pan class="mathContainer hidden">pan class="mathCode">ath altimg="si0027.gif" overflow="scroll">~ath>pan>pan>pan>13.79 and a quality factor pan id="mmlsi0028" class="mathmlsrc">pan class="formulatext stixSupport mathImg" data-mathURL="/science?_ob=MathURL&_method=retrieve&_eid=1-s2.0-S0272884215024372&_mathId=si0028.gif&_user=111111111&_pii=S0272884215024372&_rdoc=1&_issn=02728842&md5=2f33dd7cfd303b524eb617babd1ee5cc" title="Click to view the MathML source">Qfpan>pan class="mathContainer hidden">pan class="mathCode">ath altimg="si0028.gif" overflow="scroll">athvariant="italic">Qfath>pan>pan>pan>pan id="mmlsi0027" class="mathmlsrc">pan class="formulatext stixSupport mathImg" data-mathURL="/science?_ob=MathURL&_method=retrieve&_eid=1-s2.0-S0272884215024372&_mathId=si0027.gif&_user=111111111&_pii=S0272884215024372&_rdoc=1&_issn=02728842&md5=eda006f01831be3478657933a7966182" title="Click to view the MathML source">~pan>pan class="mathContainer hidden">pan class="mathCode">ath altimg="si0027.gif" overflow="scroll">~ath>pan>pan>pan>56,876 GHz (measured at 8.93 GHz). On a substrate made up of this ceramic, a low pass filter of 2.6 GHz cut-off was simulated using Sonnet Lite software and then fabricated. The measured results show a reasonably good agreement with the simulated results. This dielectric shows ~68% size reduction as comparison to FR4 substrate for the same filter design.

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