Step-stress accelerated testing of high-power LED lamps based on subsystem isolation method
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- 作者：Miao Caia ; Daoguo Yanga ; daoguo_yang@163.com" class="auth_mail" title="E-mail the corresponding author ; Kunmiao Tiana ; Ping Zhanga ; Xianping Chena ; Lilin Liub ; Guoqi Zhanga ; c
- 关键词：High-power LED lamp ; Step-stress accelerated test ; Subsystem isolation method ; Lifetime ; Degradation ; Mechanism
- 刊名：Microelectronics Reliability
- 出版年：2015
- 出版时间：August-September 2015
- 年：2015
- 卷：55
- 期：9-10
- 页码：1784-1789
- 全文大小：1111 K
文摘
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The step-stress accelerated testing for high-power LED lamps is proposed.
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The LED light source subsystem is accelerated based on an isolation method.
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The reliability of LED light source subsystem is extrapolated with SSADT model.
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The reliability of the LED lamp is deduced by a fault tree and Monte Carlo algorithm.
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The proposed procedure is effective in accelerating the decay process of LED lamps.