Multiple ionization effects in M X-ray emission induced by heavy ions

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• 作者：Xing Wang^a ; ^b ; Yongtao Zhao^b ; ^{zhaoyt@impcas.ac.cn} ; Rui Cheng^b ; Xianming Zhou^b ; Ge Xu^b ; ^d ; Yuanbo Sun^b ; Yu Lei^b ; Yuyu Wang^b ; Jieru Ren^b ; ^d ; Yang Yu^b ; ^d ; Yongfeng Li^b ; ^d ; Xiaoan Zhang^c ; Yaozong Li^c ; Changhui Liang^c ; Guoqing Xiao^b
• 关键词：X-ray emission ; Multiple ionization effect ; Heavy ions ; Ionization cross section
• 刊名：Physics Letters A
• 出版年：2012
• 出版时间：5 March, 2012
• 年：2012
• 卷：376
• 期：14
• 页码：1197-1200
• 全文大小：288 K

文摘

M-shell ionization of tungsten by Ar¹²⁺ ions were investigated in the energy range of 1.2-3.0 MeV. The measurements were also implemented for H, He and Xe ions as a comparative study. A significant shift of the M X-ray lines to the higher energy side caused by multiple ionizations, which was verified by the analysis of the intensity ratios of and , was observed. The total experimental cross sections of tungsten were compared with the PWBA and ECPSSR theoretical predictions, which are based on two extreme assumptions, namely, single ionization and full ionization.