Spatially-resolved flat-field soft X-ray spectrometer on experimental advanced superconducting tokamak
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- 作者：Yongcai Shen ; Bo Lu ; Xuewei Du ; Yingying Li ; Jia Fu ; Fudi Wang ; Hongming Zhang ; Yanwei Xiong ; Qiuping Wang ; Yuejiang Shi ; Baonian Wan
- 关键词：52.70.Kz ; 52.25.Vy ; 33.20.Ni
- 刊名：Fusion Engineering and Design
- 出版年：2013
- 出版时间：November, 2013
- 年：2013
- 卷：88
- 期：11
- 页码：3072-3077
- 全文大小：1599 K
文摘
A space- and time-resolved flat-field soft X-ray spectrometer with the wavelength range of 1-13 nm has been developed to study impurity behavior on the Experimental Advanced Superconducting Tokamak (EAST). Using an entrance slit, a varied line spacing grating (2400 grooves/mm at the grating center), and a charged coupled device (CCD) system, time evolution of profiles of impurity line emissions were recorded. The spectral resolution of the spectrometer is 0.006 nm at 5 nm when the width of entrance slit is set at 0.03 mm. The best spatial resolution obtained is 24.5 mm with the height of slit at 1.0 mm. The spectrometer is placed 8000 mm away from the plasma center and the observed spatial range covers 0-450 mm from the equatorial plane of EAST. The first experimental results were obtained from the recent EAST campaign. The system was shown to be capable of observing spectral lines from both intrinsic low-Z impurities (C, O, et al.) and highly ionized medium- and high-Z impurities (Fe, Cr, Ni, Cu, et al.). Spectral lines from the full wavelength range (1-13 nm) can be obtained by moving the position of the CCD. Spectra with the wavelength intervals of 1-2 nm show strong metal lines for H-mode discharges. Time evolutions of C VI (3.373 nm) and O VIII (1.897 nm) lines are presented and detail analysis is performed combining electron density intensity, D¦Á and soft X-ray and extreme ultraviolet (XUV) radiation intensities. Evolutions of profiles of C VI (3.373 nm) and O VIII (1.897 nm) at core plasma were also shown, indicating that the spectrometer can be applied for impurity transport studies,