Defect classification by pulsed eddy current technique in con-casting slabs based on spectrum analysis and wavelet decomposition

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• 作者：Xuanbing Qiu ; Peng Zhang ; Jilin Wei ; Xiaochao Cui ; Chao Wei ; Lulu Liu
• 关键词：Defect classification ; Pulsed eddy current ; Wavelet decomposition ; Spectrum analysis ; Principal component analysis ; Linear discriminant analysis ; Bayesian classification
• 刊名：Sensors and Actuators A: Physical
• 出版年：1 December, 2013
• 年：2013
• 卷：203
• 期：Complete
• 页码：272-281
• 全文大小：1324 K

文摘

By comparison with traditional eddy current inspection, abundant response in wide frequency range and more utilized information both in the time-domain and frequency-domain can be realized by pulsed eddy current (PEC). However, the lift-off effect, measurement noise, and the surface oxidation are observed to negatively effects time-domain feature during PEC classification of the con-casting slabs (CCS). In this work, the spectrum analysis (SA) and SA after wavelet decomposition (SA-WD) are proposed for feature extraction. The principal component analysis (PCA) plus to PCA linear discriminant analysis (PCA-LDA) are aimed at counteracting the dimensional methods which are used for supplying the lower dimensional features. The Bayesian classifier is also applied to defect classification. The experimental results demonstrate that the cracks and cavities in surface and sub-surface can be classified satisfactorily by the proposed methods, which have the potential for gauging automatic in situ classification for CCS.