Assessing the Purity of Metal−Organic Frameworks Using Photoluminescence: MOF-5, ZnO Quantum Dots, and Framework Decomposition
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- 作者：Patrick L. Feng ; John J. Perry IV ; Stefan Nikodemski ; Benjamin W. Jacobs ; Scott T. Meek ; Mark D. Allendorf
- 刊名：Journal of the American Chemical Society
- 出版年：2010
- 出版时间：November 10, 2010
- 年：2010
- 卷：132
- 期：44
- 页码：15487-15489
- 全文大小：185K
- 年卷期：v.132,no.44(November 10, 2010)
- ISSN：1520-5126
文摘
Photoluminescence (PL) spectroscopy was used to characterize nanoscale ZnO impurities, amine-donor charge-transfer exciplexes, and framework decomposition in samples of MOF-5 prepared by various methods. The combined results cast doubt on previous reports describing MOF-5 as a semiconductor and demonstrate that PL as a tool for characterizing MOF purity possesses advantages such as simplicity, speed, and sensitivity over currently employed powder XRD MOF characterization methods.