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Probing Quantum Confinement within Single Core鈥揗ultishell Nanowires
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文摘
Theoretically core鈥搈ultishell nanowires under a cross-section of hexagonal geometry should exhibit peculiar confinement effects. Using a hard X-ray nanobeam, here we show experimental evidence for carrier localization phenomena at the hexagon corners by combining synchrotron excited optical luminescence with simultaneous X-ray fluorescence spectroscopy. Applied to single coaxial n-GaN/InGaN multiquantum-well/p-GaN nanowires, our experiment narrows the gap between optical microscopy and high-resolution X-ray imaging and calls for further studies on the underlying mechanisms of optoelectronic nanodevices.

Keywords:

Core鈭抦ultishell nanowires; carrier confinement; X-ray nanoprobe; light-emitting diodes; nanodevices

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