Development of Ion Drift-Chemical Ionization Mass Spectrometry
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- 作者：Edward C. Fortner ; Jun Zhao ; and Renyi Zhang
- 刊名：Analytical Chemistry
- 出版年：2004
- 出版时间：September 15, 2004
- 年：2004
- 卷：76
- 期：18
- 页码：5436 - 5440
- 全文大小：69K
- 年卷期：v.76,no.18(September 15, 2004)
- ISSN：1520-6882
文摘
An ion drift-chemical ionization mass spectrometry (ID-CIMS) technique has been developed to detect andquantify trace gases, including volatile organic compoundsand inorganic species. The trace species are chemicallyionized into positive or negative product ions with a well-controlled ion-molecule reaction time. The ID-CIMSmethod allows for quantification of the trace gases withoutthe necessity of performing calibrations with authenticstandards for the trace gases. Demonstrations of theability of ID-CIMS to accurately quantify isoprene andHNO3 in a laboratory setting are presented. The resultsillustrate that the ID-CIMS technique facilitates detectionand quantification of organic and inorganic species inlaboratory kinetic investigations and field measurements.