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Origins of sp3C peaks in C1s X-ray Photoelectron Spectra of Carbon Materials
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文摘
X-ray photoelectron spectroscopy (XPS) is among the most powerful techniques to analyze defective structures of carbon materials such as graphene and activated carbon. However, reported assignments of defects, especially sp3C and sp2C, are questionable. Most reports assign sp3C peaks to be higher than sp2C peaks, whereas a few reports assign sp3C peaks to be lower than sp2C peaks. Our group previously reported that calculated binding energies of sp3C were basically lower than those of sp2C. This work clarified that one of the reasons for the prevailing ambiguous assignments of sp3C peaks is charging effects of diamond.

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