Probing the Growth Habit of Highly Single Crystalline Twinned V-Shape RuO2 Nanowires by Polarized Raman Scattering

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• 作者：Hae-Young Shin ; Jaeyeon Lee ; Yumin Lee ; Sewon Jeong ; Hayoung Jung ; Hak Ki Yu ; Jeong Min Baik ; Myung Hwa Kim ; Seokhyun Yoon
• 刊名：Journal of Physical Chemistry C
• 出版年：2014
• 出版时间：September 4, 2014
• 年：2014
• 卷：118
• 期：35
• 页码：20716-20720
• 全文大小：391K
• ISSN：1932-7455

文摘

Polarized Raman scattering measurements have been carefully employed to explore the growth orientation and direction of a highly single crystalline twinned V-shaped ruthenium dioxide nanowire which were directly grown on a Si wafer with the thin SiO₂ layer at 750 掳C without any catalyst via a vapor phase transport process. Interestingly, the morphology of most of nanowires represents a well-defined twinned V-shape with a specific angle of approximately 52掳 between the two branches under a specific growth condition. We measured polarized Raman spectra of a single V-shaped nanowire and calculated the Raman intensity of RuO₂ nanowire by considering a crystal coordinate. We observed that each branch of a V-shaped RuO₂ nanowire grows into [001] direction, exactly consistent with the prediction of the growth direction by high resolution transmission electron microscopy (HRTEM).