High-Throughput Graphene Imaging on Arbitrary Substrates with Widefield Raman Spectroscopy
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- 作者：Robin W. Havener ; Sang-Yong Ju ; Lola Brown ; Zenghui Wang ; Michal Wojcik ; Carlos S. Ruiz-Vargas ; Jiwoong Park
- 刊名：ACS Nano
- 出版年：2012
- 出版时间：January 24, 2012
- 年：2012
- 卷：6
- 期：1
- 页码：373-380
- 全文大小：573K
- 年卷期：v.6,no.1(January 24, 2012)
- ISSN：1936-086X
文摘
Raman spectroscopy has been used extensively to study graphene and other sp2-bonded carbon materials, but the imaging capability of conventional micro-Raman spectroscopy is limited by the technique鈥檚 low throughput. In this work, we apply an existing alternative imaging mode, widefield Raman imaging (WRI), to image and characterize graphene films on arbitrary substrates with high throughput. We show that WRI can be used to image graphene orders of magnitude faster than micro-Raman imaging allows, while still obtaining detailed spectral information about the sample. The advantages of WRI allow characterization of graphene under conditions that would be impossible or prohibitively time-consuming with other techniques, such as micro-Raman imaging or reflected optical microscopy. To demonstrate these advantages, we show that WRI enables graphene imaging on a large variety of substrates (copper, unoxidized silicon, suspended), large-scale studies of defect distribution in CVD graphene samples, and real-time imaging of dynamic processes.