Asymmetric Doping in Silicon Nanostructures: The Impact of Surface Dangling Bonds

详细信息    查看全文

• 作者：Ki-Ha Hong ; Jongseob Kim ; Jung Hoon Lee ; Jaikwang Shin ; U-In Chung
• 刊名：Nano Letters
• 出版年：2010
• 出版时间：May 12, 2010
• 年：2010
• 卷：10
• 期：5
• 页码：1671-1676
• 全文大小：352K
• 年卷期：v.10,no.5(May 12, 2010)
• ISSN：1530-6992

文摘

We investigate peculiar dopant deactivation behaviors of Si nanostrucures with first principle calculations and reveal that surface dangling bonds (SDBs) on Si nanostructures could be fundamental obstacles in nanoscale doping. In contrast to bulk Si, as the size of Si becomes smaller, SDBs on Si nanostructures prefer to be charged and asymmetrically deactivate n- and p-type doping. The asymmetric dopant deactivation in Si nanostructures is ascribed to the preference for negatively charged SDBs as a result of a larger quantum confinement effect on the conduction band. On the basis of our results, we show that the control of the growth direction of silicon nanowire as well as surface passivation is very important in preventing dopant deactivation.