Quantitative Chemical Derivatization Technique in Time-of-Flight Secondary Ion Mass Spectrometry for Surface Amine Groups on Plasma-Polymerized Ethylenediamine Film
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- 作者：Jinmo Kim ; Hyun Kyong Shon ; Donggeun Jung ; Dae Won Moon ; Sang Yun Han ; and Tae Geol Lee
- 刊名：Analytical Chemistry
- 出版年：2005
- 出版时间：July 1, 2005
- 年：2005
- 卷：77
- 期：13
- 页码：4137 - 4141
- 全文大小：222K
- 年卷期：v.77,no.13(July 1, 2005)
- ISSN：1520-6882
文摘
A chemical derivatization technique in time-of-flight secondary ion mass spectrometry (TOF-SIMS) has beendeveloped to quantify the surface density of amine groupsof plasma-polymerized ethylenediamine thin film deposited on a glass surface by inductively coupled plasmachemical vapor deposition. Chemical tags of 4-nitrobenzaldehyde or pentafluorobenzaldehyde were hybridizedwith the surface amine groups and were detected in TOF-SIMS spectra as characteristic molecular secondary ions.The surface amine density was controlled in a reproducible manner as a function of deposition plasma power andwas also quantified using UV-visible spectroscopy. Agood linear correlation was observed between the resultsof TOF-SIMS and UV-visible measurements as a functionof plasma power. This shows that the chemical derivatization technique in TOF-SIMS analysis would be usefulin quantifying the surface density of specific functionalgroups that exist on the organic surface.