Numerical Simulation of Scanning Electrochemical Microscopy Experiments with Frame-Shaped Integrated Atomic Force Microscopy-SECM Probes Using the Boundary Element Method
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- 作者：Oleg Sklyar ; Angelika Kueng ; Christine Kranz ; Boris Mizaikoff ; Alois Lugstein ; Emmerich Bertagnolli ; and Gunther Wittstock
- 刊名：Analytical Chemistry
- 出版年：2005
- 出版时间：February 1, 2005
- 年：2005
- 卷：77
- 期：3
- 页码：764 - 771
- 全文大小：399K
- 年卷期：v.77,no.3(February 1, 2005)
- ISSN：1520-6882
文摘
Integrated submicroelectrodes for combined AFM-SECMmeasurements are characterized with numerical simulations using the boundary element method. SECM approach curves and SECM images are calculated andanalyzed for a model substrate containing pronouncedtopographical and electrochemical features. The theoretically calculated image has been compared to the experimental data and shows excellent quantitative agreement.Hence, the applicability of integrated AFM-SECM electrodes for combined electrochemical and topographicalimaging and a profound theoretical description includingquantification of the obtained results are demonstrated.