Interfacial Mobility and Bonding Strength in Nanocomposite Thin Film Membranes
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- 作者：Jason P. Killgore ; René ; M. Overney
- 刊名：Langmuir
- 出版年：2008
- 出版时间：April 1, 2008
- 年：2008
- 卷：24
- 期：7
- 页码：3446 - 3451
- 全文大小：340K
- 年卷期：v.24,no.7(April 1, 2008)
- ISSN：1520-5827
文摘
The interfacial interaction strength and transition properties in a reverse selective thin film nanocomposite system,silica-poly[(trimethylsilyl)propyne] (SiOx-PTMSP), are investigated locally by heated tip atomic force microscopy.SiOx-PTMSP has recently been introduced as a new class of reverse selective membrane materials with extraordinarilyhigh permeability and selectivity (reverse selectivity). Here, we examine the thermal transition properties of thepolymer matrix and the debonding strength between PTMSP and silica. Transitions at 330 
mages/entities/deg.gif">C were identified asdegradation processes. Criteria for debonding were found to include polymer viscoelastic responses, particle size,embedding depth, scan speed, and frequency of impact. Probe-particle impact forces revealed a debonding energyof 2.6 J/m2 and an impact force transition that occurs 30 mages/entities/deg.gif">C below the degradation temperature in the neat polymer,confirming the presence of enhanced polymer mobility at the SiOx-PTMSP interface.