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In Situ Measurement of CO2 and H2O Adsorption by ZIF-8 Films
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文摘
The adsorption of CO2 and H2O by ZIF-8 thin films was investigated using X-ray photoelectron spectroscopy (XPS) and temperature-programmed desorption (TPD) in situ under low-temperature, low-pressure conditions. Using these two techniques, we demonstrate the ability to clearly distinguish molecules that exhibit significant adsorption in the pore structure of ZIF-8, from molecules that adsorb predominantly at outer surface sites. In particular, CO2 was found to penetrate into the pore structure, while H2O resided predominantly at the surface. CO2 uptake was quantified, and mobility within the films was investigated. The ability to distinguish surface processes from those that primarily occur in the bulk is key to understanding the properties of nanoporous materials.

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