Compression of Nanowires Using a Flat Indenter: Diametrical Elasticity Measurement
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- 作者：Zhao Wang ; William M. Mook ; Christoph Niederberger ; Rudy Ghisleni ; Laetitia Philippe ; Johann Michler
- 刊名：Nano Letters
- 出版年：2012
- 出版时间：May 9, 2012
- 年：2012
- 卷：12
- 期：5
- 页码：2289-2293
- 全文大小：277K
- 年卷期：v.12,no.5(May 9, 2012)
- ISSN：1530-6992
文摘
A new experimental approach for the characterization of the diametrical elastic modulus of individual nanowires is proposed by implementing a micro/nanoscale diametrical compression test geometry, using a flat punch indenter. A 250 nm diameter single crystal silicon nanowire is compressed inside of a scanning electron microscope. Since silicon is highly anisotropic, the wire crystal orientation in the compression axis is determined by electron backscatter diffraction. In order to analyze the load-displacement compression data, a two-dimensional analytical closed-form solution based on a classical contact model is proposed. The results of the analytical model are compared with those of finite element simulations and to the experimental diametrical compression results and show good agreement.