Morphology of anodic alumina films obtained by hard anodization: Influence of the rate of anodization voltage increase

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• 作者：I. V. Roslyakov ; N. S. Kuratova…
• 关键词：anodic alumina ; porous films ; anodization voltage ramp ; small ; angle X ; ray diffraction ; mechanical deformations
• 刊名：Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
• 出版年：2016
• 出版时间：January 2016
• 年：2016
• 卷：10
• 期：1
• 页码：191-197
• 全文大小：1,561 KB
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• 作者单位：I. V. Roslyakov (1) (2) (3)
  N. S. Kuratova (1)
  D. S. Koshkodaev (4)
  D. Hermida Merino (5)
  A. V. Lukashin (1) (2) (3)
  K. S. Napolskii (1) (2) (3)
  
  1. Department of Materials Science, Lomonosov Moscow State University, Moscow, 119991, Russia
  2. Department of Chemistry, Lomonosov Moscow State University, Moscow, 119991, Russia
  3. Foundation “National Intellectual Development”, Moscow, 119991, Russia
  4. National Research University of Electronic Technology, Zelenograd, Moscow, 124498, Russia
  5. DUBBLE CRG ESRF BM26, F-38043, Grenoble Cedex, France
  
• 刊物类别：Chemistry and Materials Science
• 刊物主题：Chemistry
  Surfaces and Interfaces and Thin Films
  Russian Library of Science
  
• 出版者：MAIK Nauka/Interperiodica distributed exclusively by Springer Science+Business Media LLC.
• ISSN：1819-7094

文摘

The influence of the anodization voltage ramp on the morphology and thickness homogeneity of porous anodic alumina films was studied. The samples were prepared in the oxalic acid at 120 V during the hard anodization process. As a nondestructive characterization method, the smallangle Xray scattering technique was used. The analysis of diffraction patterns allows determining the mean value and dispersion of interpore distance and the channel tortuosity with high accuracy. The increase of voltage ramp at the initial stage of hard anodization process was shown to lead to reduction of mechanical deformation (tortuosity) of anodic alumina film during crystallization.